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XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5mol% H2/Ar) atmosphere
XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5mol% H2/Ar) atmosphere
XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5mol% H2/Ar) atmosphere
Achiwawanich, S. (Autor:in) / James, B. D. (Autor:in) / Liesegang, J. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 2388-2399
01.01.2008
12 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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