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    XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5mol% H2/Ar) atmosphere

    New search for: Achiwawanich, S.
    New search for: James, B. D.
    New search for: Liesegang, J.

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    XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5mol% H2/Ar) atmosphere

    New search for: Achiwawanich, S.
    New search for: James, B. D.
    New search for: Liesegang, J.

    Access

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    Check availability in my library
    Order at Subito €

    XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5mol% H2/Ar) atmosphere

    New search for: Achiwawanich, S.
    New search for: James, B. D.
    New search for: Liesegang, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5mol% H2/Ar) atmosphere

    Contributors:

    Achiwawanich, S. (author) / James, B. D. (author) / Liesegang, J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 255 ; 2388-2399

    Publication date:

    2008-01-01

    Size:

    12 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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