Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations: Fid-Bau Portal

Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Zhang, J. / Liu, B. / Wang, J.Y. / Zhou, Y.C.

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Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Zhang, J. / Liu, B. / Wang, J.Y. / Zhou, Y.C.

Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Zhang, J. / Liu, B. / Wang, J.Y. / Zhou, Y.C.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Titel:

Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Beteiligte:

Zhang, J. (Autor:in) / Liu, B. (Autor:in) / Wang, J.Y. (Autor:in) / Zhou, Y.C. (Autor:in)

Erschienen in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 39-49

Erscheinungsdatum:

01.01.2009

Format / Umfang:

11 pages

ISSN:

0884-2914

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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