Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations: Fid-Bau Portal

Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Zhang, J. / Liu, B. / Wang, J.Y. / Zhou, Y.C.

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Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Zhang, J. / Liu, B. / Wang, J.Y. / Zhou, Y.C.

Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Zhang, J. / Liu, B. / Wang, J.Y. / Zhou, Y.C.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Low-temperature instability of Ti~2SnC: A combined transmission electron microscopy, differential scanning calorimetry, and x-ray diffraction investigations

Contributors:

Zhang, J. (author) / Liu, B. (author) / Wang, J.Y. (author) / Zhou, Y.C. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 39-49

Publication date:

2009-01-01

Size:

11 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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