Microstructure evolution of Ca~0~.~3~3CoO~2 thin films investigated by high-angle annular dark-field scanning transmission electron microscopy: Fid-Bau Portal

Microstructure evolution of Ca~0~.~3~3CoO~2 thin films investigated by high-angle annular dark-field scanning transmission electron microscopy

Huang, R. / Mizoguchi, T. / Sugiura, K. / Nakagawa, S.-i. / Ohta, H. / Saito, T. / Koumoto, K. / Hirayama, T. / Ikuhara, Y.

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Microstructure evolution of Ca~0~.~3~3CoO~2 thin films investigated by high-angle annular dark-field scanning transmission electron microscopy

Huang, R. / Mizoguchi, T. / Sugiura, K. / Nakagawa, S.-i. / Ohta, H. / Saito, T. / Koumoto, K. / Hirayama, T. / Ikuhara, Y.

Microstructure evolution of Ca~0~.~3~3CoO~2 thin films investigated by high-angle annular dark-field scanning transmission electron microscopy

Huang, R. / Mizoguchi, T. / Sugiura, K. / Nakagawa, S.-i. / Ohta, H. / Saito, T. / Koumoto, K. / Hirayama, T. / Ikuhara, Y.

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Titel:

Microstructure evolution of Ca~0~.~3~3CoO~2 thin films investigated by high-angle annular dark-field scanning transmission electron microscopy

Beteiligte:

Huang, R. (Autor:in) / Mizoguchi, T. (Autor:in) / Sugiura, K. (Autor:in) / Nakagawa, S.-i. (Autor:in) / Ohta, H. (Autor:in) / Saito, T. (Autor:in) / Koumoto, K. (Autor:in) / Hirayama, T. (Autor:in) / Ikuhara, Y. (Autor:in)

Erschienen in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 279-287

Erscheinungsdatum:

01.01.2009

Format / Umfang:

9 pages

ISSN:

0884-2914

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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