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Microstructure evolution of Ca~0~.~3~3CoO~2 thin films investigated by high-angle annular dark-field scanning transmission electron microscopy
Microstructure evolution of Ca~0~.~3~3CoO~2 thin films investigated by high-angle annular dark-field scanning transmission electron microscopy
Microstructure evolution of Ca~0~.~3~3CoO~2 thin films investigated by high-angle annular dark-field scanning transmission electron microscopy
Huang, R. (author) / Mizoguchi, T. (author) / Sugiura, K. (author) / Nakagawa, S.-i. (author) / Ohta, H. (author) / Saito, T. (author) / Koumoto, K. (author) / Hirayama, T. (author) / Ikuhara, Y. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 24 ; 279-287
2009-01-01
9 pages
Article (Journal)
English
DDC:
620.11
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A New Approach for Electron Tomography: Annular Dark-Field Transmission Electron Microscopy
British Library Online Contents | 2006
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