Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
The Effect of Nitridation on SiC MOS Oxides as Evaluated by Charge Pumping
The Effect of Nitridation on SiC MOS Oxides as Evaluated by Charge Pumping
The Effect of Nitridation on SiC MOS Oxides as Evaluated by Charge Pumping
Habersat, D.B. (Autor:in) / Lelis, A.J. (Autor:in) / McGarrity, J.M. (Autor:in) / McLean, F.B. (Autor:in) / Potbhare, S. (Autor:in)
MATERIALS SCIENCE FORUM ; 600/603 ; 743-746
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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