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Influence of Passivation Oxide Properties on SiC Field-Plated Buried Gate MESFETs
Influence of Passivation Oxide Properties on SiC Field-Plated Buried Gate MESFETs
Influence of Passivation Oxide Properties on SiC Field-Plated Buried Gate MESFETs
Nilsson, P.A. (Autor:in) / Sudow, M. (Autor:in) / Allerstam, F. (Autor:in) / Andersson, K. (Autor:in) / Sveinbjornsson, E.O. (Autor:in) / Hjelmgren, H. (Autor:in) / Rorsman, N. (Autor:in)
MATERIALS SCIENCE FORUM ; 600/603 ; 1103-1106
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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