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Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light
Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light
Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light
Kilmametov, A. R. (Autor:in) / Vaughan, G. (Autor:in) / Yavari, A. R. (Autor:in) / LeMoulec, A. (Autor:in) / Botta, W. J. (Autor:in) / Valiev, R. Z. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 503 ; 10-13
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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