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Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light
Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light
Microstructure evolution in copper under severe plastic deformation detected by in situ X-ray diffraction using monochromatic synchrotron light
Kilmametov, A. R. (author) / Vaughan, G. (author) / Yavari, A. R. (author) / LeMoulec, A. (author) / Botta, W. J. (author) / Valiev, R. Z. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 503 ; 10-13
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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