Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Light-beam-induced current measurements on copper-nickel co-contaminated Cz-silicon bicrystals
Light-beam-induced current measurements on copper-nickel co-contaminated Cz-silicon bicrystals
Light-beam-induced current measurements on copper-nickel co-contaminated Cz-silicon bicrystals
Saring, P. (Autor:in) / Rudolf, C. (Autor:in) / Stolze, L. (Autor:in) / Seibt, M. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 159-160 ; 216-218
01.01.2009
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Strain Induced Grain Boundary Premelting in Copper Bicrystals
British Library Online Contents | 1997
|EBIC and DLTS of the Electrical Activity of Fe-Contaminated Silicon Bicrystals
British Library Online Contents | 1996
|Fractography of embrittled copper bicrystals
British Library Online Contents | 1993
|Cyclic deformation behavior of copper bicrystals
British Library Online Contents | 1996
|Dislocation structures in cyclically deformed copper bicrystals
British Library Online Contents | 1997
|