Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
EBIC and DLTS of the Electrical Activity of Fe-Contaminated Silicon Bicrystals
EBIC and DLTS of the Electrical Activity of Fe-Contaminated Silicon Bicrystals
EBIC and DLTS of the Electrical Activity of Fe-Contaminated Silicon Bicrystals
Ihlal, A. (Autor:in) / Rizk, R. (Autor:in) / Voivenel, P. (Autor:in) / Nouet, G. (Autor:in)
MATERIALS SCIENCE FORUM ; 617-620
01.01.1996
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
EBIC study on the electrical activity of stacking faults in silicon
British Library Online Contents | 1996
|Local Electrical Activity of Al Doped Tilt Boundaries Silicon Bicrystals by STEBIC
British Library Online Contents | 1993
|Light-beam-induced current measurements on copper-nickel co-contaminated Cz-silicon bicrystals
British Library Online Contents | 2009
|DLTS Studies of Thermally Treated Carbon-Rich Silicon
British Library Online Contents | 1994
|DLTS analysis of nickel-hydrogen complex defects in silicon
British Library Online Contents | 1999
|