Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Nanoimaging in SiC and Related Materials: Beyond Surface Morphology to Charge Transport and Physical Parameters Mapping
Nanoimaging in SiC and Related Materials: Beyond Surface Morphology to Charge Transport and Physical Parameters Mapping
Nanoimaging in SiC and Related Materials: Beyond Surface Morphology to Charge Transport and Physical Parameters Mapping
Raineri, V. (Autor:in) / Giannazzo, F. (Autor:in) / Roccaforte, F. (Autor:in)
MATERIALS SCIENCE FORUM ; 615/617 ; 417-422
01.01.2009
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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