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    Nanoimaging in SiC and Related Materials: Beyond Surface Morphology to Charge Transport and Physical Parameters Mapping

    New search for: Raineri, V.
    New search for: Giannazzo, F.
    New search for: Roccaforte, F.

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    Nanoimaging in SiC and Related Materials: Beyond Surface Morphology to Charge Transport and Physical Parameters Mapping

    New search for: Raineri, V.
    New search for: Giannazzo, F.
    New search for: Roccaforte, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nanoimaging in SiC and Related Materials: Beyond Surface Morphology to Charge Transport and Physical Parameters Mapping

    New search for: Raineri, V.
    New search for: Giannazzo, F.
    New search for: Roccaforte, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Nanoimaging in SiC and Related Materials: Beyond Surface Morphology to Charge Transport and Physical Parameters Mapping

    Contributors:

    Raineri, V. (author) / Giannazzo, F. (author) / Roccaforte, F. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 615/617 ; 417-422

    Publication date:

    2009-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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