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Interface Trap Density and Mobility Characterization of Silicon Carbide MOSFET Inversion Layers
Interface Trap Density and Mobility Characterization of Silicon Carbide MOSFET Inversion Layers
Interface Trap Density and Mobility Characterization of Silicon Carbide MOSFET Inversion Layers
Tilak, V. (Autor:in) / Matocha, K. (Autor:in) / Dunne, G. (Autor:in)
MATERIALS SCIENCE FORUM ; 615/617 ; 801-804
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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