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Measurement of non-DLVO force on a silicon substrate coated with ammonium poly(acrylic acid) using scanning probe microscopy
Measurement of non-DLVO force on a silicon substrate coated with ammonium poly(acrylic acid) using scanning probe microscopy
Measurement of non-DLVO force on a silicon substrate coated with ammonium poly(acrylic acid) using scanning probe microscopy
Isobe, T. (Autor:in) / Nakano, Y. (Autor:in) / Kameshima, Y. (Autor:in) / Nakajima, A. (Autor:in) / Okada, K. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 8710-8713
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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