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    Measurement of non-DLVO force on a silicon substrate coated with ammonium poly(acrylic acid) using scanning probe microscopy

    New search for: Isobe, T.
    New search for: Nakano, Y.
    New search for: Kameshima, Y.
    New search for: Nakajima, A.
    New search for: Okada, K.

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    Measurement of non-DLVO force on a silicon substrate coated with ammonium poly(acrylic acid) using scanning probe microscopy

    New search for: Isobe, T.
    New search for: Nakano, Y.
    New search for: Kameshima, Y.
    New search for: Nakajima, A.
    New search for: Okada, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Measurement of non-DLVO force on a silicon substrate coated with ammonium poly(acrylic acid) using scanning probe microscopy

    New search for: Isobe, T.
    New search for: Nakano, Y.
    New search for: Kameshima, Y.
    New search for: Nakajima, A.
    New search for: Okada, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Measurement of non-DLVO force on a silicon substrate coated with ammonium poly(acrylic acid) using scanning probe microscopy

    Contributors:

    Isobe, T. (author) / Nakano, Y. (author) / Kameshima, Y. (author) / Nakajima, A. (author) / Okada, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 255 ; 8710-8713

    Publication date:

    2009-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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