Investigation of initial growth and very thin (112 0) ZnO films by cross-sectional and plan-view transmission electron microscopy: Fid-Bau Portal

Investigation of initial growth and very thin (112 0) ZnO films by cross-sectional and plan-view transmission electron microscopy

Lee, J. W. / Han, S. K. / Hong, S. K. / Lee, J. Y.

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Investigation of initial growth and very thin (112 0) ZnO films by cross-sectional and plan-view transmission electron microscopy

Lee, J. W. / Han, S. K. / Hong, S. K. / Lee, J. Y.

Investigation of initial growth and very thin (112 0) ZnO films by cross-sectional and plan-view transmission electron microscopy

Lee, J. W. / Han, S. K. / Hong, S. K. / Lee, J. Y.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Dokumentinformationen

Titel:

Investigation of initial growth and very thin (112 0) ZnO films by cross-sectional and plan-view transmission electron microscopy

Beteiligte:

Lee, J. W. (Autor:in) / Han, S. K. (Autor:in) / Hong, S. K. (Autor:in) / Lee, J. Y. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 256 ; 1849-1854

Erscheinungsdatum:

01.01.2010

Format / Umfang:

6 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 621.35

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