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Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy
Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy
Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy
Naito, M. (Autor:in) / Ishimaru, M. (Autor:in) / Hirotsu, Y. (Autor:in) / Takashima, M. (Autor:in) / Matsumoto, H. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 41 ; 2615-2619
01.01.2006
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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