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Characterization of Y2O3 gate dielectric on n-GaAs substrates
Characterization of Y2O3 gate dielectric on n-GaAs substrates
Characterization of Y2O3 gate dielectric on n-GaAs substrates
Das, P. S. (Autor:in) / Dalapati, G. K. (Autor:in) / Chi, D. Z. (Autor:in) / Biswas, A. (Autor:in) / Maiti, C. K. (Autor:in)
APPLIED SURFACE SCIENCE ; 256 ; 2245-2251
01.01.2010
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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