Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Occurrence of particle debris field during focused Ga ion beam milling of glassy carbon
Occurrence of particle debris field during focused Ga ion beam milling of glassy carbon
Occurrence of particle debris field during focused Ga ion beam milling of glassy carbon
Hu, Q. (Autor:in) / O'Neill, W. (Autor:in)
APPLIED SURFACE SCIENCE ; 256 ; 5952-5956
01.01.2010
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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