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Occurrence of particle debris field during focused Ga ion beam milling of glassy carbon
Occurrence of particle debris field during focused Ga ion beam milling of glassy carbon
Occurrence of particle debris field during focused Ga ion beam milling of glassy carbon
Hu, Q. (author) / O'Neill, W. (author)
APPLIED SURFACE SCIENCE ; 256 ; 5952-5956
2010-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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