Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Corrigendum to “Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure” [Mechanics of Materials 41 (2009) 1090–1095]
Corrigendum to “Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure” [Mechanics of Materials 41 (2009) 1090–1095]
Corrigendum to “Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure” [Mechanics of Materials 41 (2009) 1090–1095]
Hasegawa, M. (Autor:in) / Sasagawa, K. (Autor:in) / Uno, S. (Autor:in) / Saka, M. (Autor:in) / Abé, H. (Autor:in)
MECHANICS OF MATERIALS ; 42 ; 1030
01.01.2010
1030 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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| British Library Online Contents | 2009
Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line
| British Library Online Contents | 2005
Damage mechanics of electromigration induced failure
| British Library Online Contents | 2008
DataCite | 1911
DataCite | 1911