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Corrigendum to “Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure” [Mechanics of Materials 41 (2009) 1090–1095]
Corrigendum to “Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure” [Mechanics of Materials 41 (2009) 1090–1095]
Corrigendum to “Derivation of film characteristic constants of polycrystalline line for reliability evaluation against electromigration failure” [Mechanics of Materials 41 (2009) 1090–1095]
Hasegawa, M. (author) / Sasagawa, K. (author) / Uno, S. (author) / Saka, M. (author) / Abé, H. (author)
MECHANICS OF MATERIALS ; 42 ; 1030
2010-01-01
1030 pages
Article (Journal)
English
DDC:
620.11
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Verification of Prediction Method for Electromigration Failure Using Angled Polycrystalline Line
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Damage mechanics of electromigration induced failure
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DataCite | 1911
DataCite | 1911