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System offers rapid, low-cost measurement of thickness and optical constants of thin films
System offers rapid, low-cost measurement of thickness and optical constants of thin films
System offers rapid, low-cost measurement of thickness and optical constants of thin films
MRS BULLETIN- MATERIALS RESEARCH SOCIETY ; 36 ; 249-251
01.01.2011
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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