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A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF
A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF
A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF
Ferlito, E. P. (Autor:in) / Alnabulsi, S. (Autor:in) / Mello, D. (Autor:in)
APPLIED SURFACE SCIENCE ; 257 ; 9925-9930
01.01.2011
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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