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    A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF

    New search for: Ferlito, E. P.
    New search for: Alnabulsi, S.
    New search for: Mello, D.

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    A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF

    New search for: Ferlito, E. P.
    New search for: Alnabulsi, S.
    New search for: Mello, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF

    New search for: Ferlito, E. P.
    New search for: Alnabulsi, S.
    New search for: Mello, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    A different approach in sample preparation method for metallic contamination study by ToF-SIMS and TXRF

    Contributors:

    Ferlito, E. P. (author) / Alnabulsi, S. (author) / Mello, D. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 257 ; 9925-9930

    Publication date:

    2011-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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