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Wafer-level fabrication and optical characterization of nanoscale patterned sapphire substrates
Wafer-level fabrication and optical characterization of nanoscale patterned sapphire substrates
Wafer-level fabrication and optical characterization of nanoscale patterned sapphire substrates
Lin, Y. S. (Autor:in) / Hsu, W. C. (Autor:in) / Huang, K. C. (Autor:in) / Yeh, J. A. (Autor:in)
APPLIED SURFACE SCIENCE ; 258 ; 2-6
01.01.2011
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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