Observation of short-wavelength recorded marks in TeOx thin film by atomic force microscopy

Li, Q. / Gan, F. | British Library Online Contents | 2001

Observation of Short-wavelength Recorded Pits in GeSb~2Te~4 Phase Change Thin Film by Atomic Force Microscopy

Men, L. / Gan, F. / Sun, J. et al. | British Library Online Contents | 1997

Observation of CdS crystal surface by atomic force microscopy

Yoshino, J. / Morimoto, J. / Wada, H. | British Library Online Contents | 1997

DNA adsorption and desorption on mica surface studied by atomic force microscopy

Sun, L. / Zhao, D. / Zhang, Y. et al. | British Library Online Contents | 2011

Observation by atomic force microscopy of calix[n]arene thin films and their thermal rearrangement

Goreloff, P. / Lamartine, R. / Coleman, A.W. | British Library Online Contents | 1998