Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties: Fid-Bau Portal

Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties

Mamedov, G. A. / Godzhaev, E. M. / Magerramov, A. M. / Zeinalov, S. A.

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Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties

Mamedov, G. A. / Godzhaev, E. M. / Magerramov, A. M. / Zeinalov, S. A.

Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties

Mamedov, G. A. / Godzhaev, E. M. / Magerramov, A. M. / Zeinalov, S. A.

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Titel:

Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties

Beteiligte:

Mamedov, G. A. (Autor:in) / Godzhaev, E. M. (Autor:in) / Magerramov, A. M. (Autor:in) / Zeinalov, S. A. (Autor:in)

Erschienen in:

SURFACE ENGINEERING AND APPLIED ELECTROCHEMISTRY C/C OF ELEKTRONNAIA OBRABOTKA MATERIALOV ; 47 ; 565-569

Erscheinungsdatum:

01.01.2011

Format / Umfang:

5 pages

ISSN:

1068-3755

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.44 / 660.297

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Lattice dynamics of layered ferroelectric semiconductor compound TlGaSe2

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Serre, I. / Salazar, D. / Vogt, J. B. | British Library Online Contents | 2008

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