Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties: Fid-Bau Portal

Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties

Mamedov, G. A. / Godzhaev, E. M. / Magerramov, A. M. / Zeinalov, S. A.

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Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties

Mamedov, G. A. / Godzhaev, E. M. / Magerramov, A. M. / Zeinalov, S. A.

Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties

Mamedov, G. A. / Godzhaev, E. M. / Magerramov, A. M. / Zeinalov, S. A.

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Title:

Atomic force microscopy studies of the surface relief of composites of high-density polyethylene and additives of TlGaSe2 and the analysis of their dielectric properties

Contributors:

Mamedov, G. A. (author) / Godzhaev, E. M. (author) / Magerramov, A. M. (author) / Zeinalov, S. A. (author)

Published in:

SURFACE ENGINEERING AND APPLIED ELECTROCHEMISTRY C/C OF ELEKTRONNAIA OBRABOTKA MATERIALOV ; 47 ; 565-569

Publication date:

2011-01-01

Size:

5 pages

ISSN:

1068-3755

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.44 / 660.297

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