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Effect of dangling bonds of ultra-thin silicon film surface on electronic states of internal atoms
Effect of dangling bonds of ultra-thin silicon film surface on electronic states of internal atoms
Effect of dangling bonds of ultra-thin silicon film surface on electronic states of internal atoms
Kamiyama, E. (Autor:in) / Sueoka, K. (Autor:in)
APPLIED SURFACE SCIENCE ; 258 ; 5265-5269
01.01.2012
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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