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    Effect of dangling bonds of ultra-thin silicon film surface on electronic states of internal atoms

    New search for: Kamiyama, E.
    New search for: Sueoka, K.

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    Effect of dangling bonds of ultra-thin silicon film surface on electronic states of internal atoms

    New search for: Kamiyama, E.
    New search for: Sueoka, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effect of dangling bonds of ultra-thin silicon film surface on electronic states of internal atoms

    New search for: Kamiyama, E.
    New search for: Sueoka, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Effect of dangling bonds of ultra-thin silicon film surface on electronic states of internal atoms

    Contributors:

    Kamiyama, E. (author) / Sueoka, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 258 ; 5265-5269

    Publication date:

    2012-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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