Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Enhanced uniformity and durability of antisticking layer in imprinting stamps
Enhanced uniformity and durability of antisticking layer in imprinting stamps
Enhanced uniformity and durability of antisticking layer in imprinting stamps
Lee, M. J. (Autor:in) / Cho, S. U. (Autor:in) / Lee, S. M. (Autor:in) / Kim, C. S. (Autor:in) / Jeong, M. Y. (Autor:in)
APPLIED SURFACE SCIENCE ; 258 ; 6545-6549
01.01.2012
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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