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Ultra-short pulsed laser ablation of silicon nitride layers: Investigation near threshold fluence
Ultra-short pulsed laser ablation of silicon nitride layers: Investigation near threshold fluence
Ultra-short pulsed laser ablation of silicon nitride layers: Investigation near threshold fluence
Heinrich, G. (Autor:in) / Wollgarten, M. (Autor:in) / Bahr, M. (Autor:in) / Lawerenz, A. (Autor:in)
APPLIED SURFACE SCIENCE ; 278 ; 265-267
01.01.2013
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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