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Micro-Displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry
Micro-Displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry
Micro-Displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry
01.01.2014
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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