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Micro-Displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry
Micro-Displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry
Micro-Displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry
2014-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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