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Observing and measuring strain in nanostructures and devices with transmission electron microscopy
Observing and measuring strain in nanostructures and devices with transmission electron microscopy
Observing and measuring strain in nanostructures and devices with transmission electron microscopy
Hytch, M.J. (Autor:in) / Minor, A.M. (Autor:in)
MRS BULLETIN- MATERIALS RESEARCH SOCIETY ; 39 ; 138
01.01.2014
138 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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