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Observing and measuring strain in nanostructures and devices with transmission electron microscopy

Hytch, M.J. / Minor, A.M.

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Observing and measuring strain in nanostructures and devices with transmission electron microscopy

Hytch, M.J. / Minor, A.M.

Observing and measuring strain in nanostructures and devices with transmission electron microscopy

Hytch, M.J. / Minor, A.M.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Observing and measuring strain in nanostructures and devices with transmission electron microscopy

Contributors:

Hytch, M.J. (author) / Minor, A.M. (author)

Published in:

MRS BULLETIN- MATERIALS RESEARCH SOCIETY ; 39 ; 138

Publication date:

2014-01-01

Size:

138 pages

ISSN:

0883-7694

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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