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SiC (0001) and (0001¯) surfaces diffusion parameters estimated by means of atomistic Kinetic Monte Carlo simulations
SiC (0001) and (0001¯) surfaces diffusion parameters estimated by means of atomistic Kinetic Monte Carlo simulations
SiC (0001) and (0001¯) surfaces diffusion parameters estimated by means of atomistic Kinetic Monte Carlo simulations
Kozlowski, M. (Autor:in) / Sowa, P. (Autor:in) / Biborski, A. (Autor:in) / Kozubski, R. (Autor:in)
MATERIALS LETTERS ; 132 ; 413-416
01.01.2014
4 pages
Aufsatz (Zeitschrift)
Englisch
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