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Microwave imaging for half-space imperfect conductors
Microwave imaging for half-space imperfect conductors
Microwave imaging for half-space imperfect conductors
Lee, Y.-H. (Autor:in) / Cheng, Y.-T. (Autor:in) / Chiu, C.-C. (Autor:in) / Chang, S.-P. (Autor:in)
NONDESTRUCTIVE TESTING AND EVALUATION ; 30 ; 49-62
01.01.2015
14 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1127
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