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Microwave imaging for half-space imperfect conductors
Microwave imaging for half-space imperfect conductors
Microwave imaging for half-space imperfect conductors
Lee, Y.-H. (author) / Cheng, Y.-T. (author) / Chiu, C.-C. (author) / Chang, S.-P. (author)
NONDESTRUCTIVE TESTING AND EVALUATION ; 30 ; 49-62
2015-01-01
14 pages
Article (Journal)
English
DDC:
620.1127
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