Investigation of sub-surface damage during sliding wear of alumina using focused ion-beam milling

Chaiwan, S. / Hoffman, M. / Munroe, P. et al. | British Library Online Contents | 2002

Time Series Analysis for the Mechanical Lapping of Single Crystal Diamond Cutting Tools

Zong, W. J. / Li, D. / Wang, H. X. et al. | British Library Online Contents | 2005

Field-induced effects of implanted Ga on high electric field diamond devices fabricated by focused ion beam

Hamada, M. / Teraji, T. / Ito, T. | British Library Online Contents | 2003

Coolant Effects on Tool Wear in Machining Single-Crystal Silicon with Diamond Tools

Ohta, T. / Yan, J.W. / Kodera, S. et al. | British Library Online Contents | 2009

Investigation of the structure of damage layers in TEM samples prepared using a focused ion beam

Rubanov, S. / Munroe, P. R. | British Library Online Contents | 2001