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Mechanisms of lamellar structure formation and Cr interfacial segregation in C11b-MoSi2/C40-NbSi2 dual phase silicide verified by a phase-field simulation incorporating elastic inhomogeneity
Mechanisms of lamellar structure formation and Cr interfacial segregation in C11b-MoSi2/C40-NbSi2 dual phase silicide verified by a phase-field simulation incorporating elastic inhomogeneity
Mechanisms of lamellar structure formation and Cr interfacial segregation in C11b-MoSi2/C40-NbSi2 dual phase silicide verified by a phase-field simulation incorporating elastic inhomogeneity
Yamazaki, T. (Autor:in) / Koizumi, Y. (Autor:in) / Yuge, K. (Autor:in) / Chiba, A. (Autor:in) / Hagihara, K. (Autor:in) / Nakano, T. (Autor:in) / Kishida, K. (Autor:in) / Inui, H. (Autor:in)
COMPUTATIONAL MATERIALS SCIENCE ; 108 ; 358-366
01.01.2015
9 pages
Aufsatz (Zeitschrift)
Englisch
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