Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure
XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure
XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure
Mahjoub, M. A. (Autor:in) / Monier, G. (Autor:in) / Robert-Goumet, C. (Autor:in) / Bideux, L. (Autor:in) / Gruzza, B. (Autor:in)
APPLIED SURFACE SCIENCE ; 357 ; 1268-1273
01.01.2015
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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