XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure: Fid-Bau Portal

XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure

Mahjoub, M. A. / Monier, G. / Robert-Goumet, C. / Bideux, L. / Gruzza, B.

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XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure

Mahjoub, M. A. / Monier, G. / Robert-Goumet, C. / Bideux, L. / Gruzza, B.

XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure

Mahjoub, M. A. / Monier, G. / Robert-Goumet, C. / Bideux, L. / Gruzza, B.

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Document information

Title:

XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure

Contributors:

Mahjoub, M. A. (author) / Monier, G. (author) / Robert-Goumet, C. (author) / Bideux, L. (author) / Gruzza, B. (author)

Published in:

APPLIED SURFACE SCIENCE ; 357 ; 1268-1273

Publication date:

2015-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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