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Length-scale-dependent deformation mechanism of Cu/X (X=Ru, W) multilayer thin films
Length-scale-dependent deformation mechanism of Cu/X (X=Ru, W) multilayer thin films
Length-scale-dependent deformation mechanism of Cu/X (X=Ru, W) multilayer thin films
MATERIALS SCIENCE AND ENGINEERING A ; 664 ; 206-214
01.01.2016
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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