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Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
Kondratenko, S. V. (Autor:in) / Lysenko, V. S. (Autor:in) / Kozyrev, Y. N. (Autor:in) / Kratzer, M. (Autor:in) / Storozhuk, D. P. (Autor:in) / Iliash, S. A. (Autor:in) / Czibula, C. (Autor:in) / Teichert, C. (Autor:in)
APPLIED SURFACE SCIENCE ; 389 ; 783-789
01.01.2016
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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