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Vibration suppression of atomic-force microscopy cantilevers covered by a piezoelectric layer with tensile force
Vibration suppression of atomic-force microscopy cantilevers covered by a piezoelectric layer with tensile force
Vibration suppression of atomic-force microscopy cantilevers covered by a piezoelectric layer with tensile force
Korayem, M. H. (Autor:in) / Alipour, A. (Autor:in) / Younesian, D. (Autor:in)
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY ; 32 ; 4135-4144
01.01.2018
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621
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