High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation: Fid-Bau Portal

High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

Chen, Z. / Lenthe, W. / Stinville, J. C. / Echlin, M. / Pollock, T. M. / Daly, S.

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High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

Chen, Z. / Lenthe, W. / Stinville, J. C. / Echlin, M. / Pollock, T. M. / Daly, S.

High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

Chen, Z. / Lenthe, W. / Stinville, J. C. / Echlin, M. / Pollock, T. M. / Daly, S.

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Titel:

High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation

Beteiligte:

Chen, Z. (Autor:in) / Lenthe, W. (Autor:in) / Stinville, J. C. (Autor:in) / Echlin, M. (Autor:in) / Pollock, T. M. (Autor:in) / Daly, S. (Autor:in)

Erschienen in:

EXPERIMENTAL MECHANICS ; 58 ; 1407-1421

Erscheinungsdatum:

01.01.2018

Format / Umfang:

15 pages

ISSN:

0014-4851

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.1

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Micro-scale deformation measurement using the digital image correlation technique and scanning electron microscope imaging

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High-temperature Deformation Measurements Using Digital-image Correlation

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